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The Effects of Flame Retardant and Electrical Current on the Reliability of IC Package

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Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0702102-152353
Date02 July 2002
CreatorsHuang, Chen-Town
ContributorsDer-shin Gan, Bae-Heng Tseng, Ker-Chang Hsieh
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0702102-152353
Rightsnot_available, Copyright information available at source archive

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