Abstract
Accompany a rapid growth in the semiconductor industry in the past few year, most components gradually used the small dimension as its basic structures. Due to the reduction of component size will induces highly concentrated on circuit and dimension, it also incurs a lots problem, such as electromagnetic interference, high temperature and thermal stress, which will decrease the product reliability. The most common damage in the semiconductor product is thermal fatigue, which is caused by thermal stress concentrated under repeatedly temperature variation loading. Usually, the thermal cycle loading is applied to induce the fatigue destruction and predict the product reliability, but this method spends one cycle for 80min which is time-consumption. Therefore, in this thesis, the finite element method package is used to simulate and evaluate the plastic variation of solder bump and the relation between different temperatures loading and equivalent plastic strain under different temperature range test. Through the Coffin-Manson equation, the equivalent plastic strain can be used to predict the fatigue live, which can be precisely accelerating the fatigue test.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0815104-162909 |
| Date | 15 August 2004 |
| Creators | Chen, Tsung-Hui |
| Contributors | T. N. Shiau, Y. C. Chen, Yii-Tay Chiou, Chi-Hui Chien |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0815104-162909 |
| Rights | restricted, Copyright information available at source archive |
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