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FSI Modeling of Blast-Induced TBI on a Chip

<p dir="ltr">The focus is on the complex nature of primary blast injury (PBI) and employs advanced simulation techniques to model the physiological impacts using a TBI-on-a-chip system. This study involves a two-way Fluid-Structure Interaction (FSI) model in ANSYS, coupling Transient Structural and Fluent modules to simulate the effects of a blast wave on brain tissue. The research explores the creation and validation of boundary conditions, such as fixed support and varying strain rates, to ensure the reliability of the experimental setup. Key findings include the non-uniform distribution of strain, which has significant implications for understanding injury mechanisms and inflammatory marker analysis. The project also provides a detailed workflow for FSI simulations, highlighting the advantages of uniform mechanical loading and its impact on experimental accuracy.</p>

  1. 10.25394/pgs.26360158.v1
Identiferoai:union.ndltd.org:purdue.edu/oai:figshare.com:article/26360158
Date26 July 2024
CreatorsSumantika Sekar (19201465)
Source SetsPurdue University
Detected LanguageEnglish
TypeText, Thesis
RightsCC BY 4.0
Relationhttps://figshare.com/articles/thesis/FSI_Modeling_of_Blast-Induced_TBI_on_a_Chip/26360158

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