The theme of this diploma thesis is the design of a scanning electron microscope with a focused ion beam. Specifically, the thesis is focused on the design of the microscope covers and the adjacent workplace of the operator for Tescan Orsay Holding a.s.. Design is solved as the first proposal aimed at future innovation of the design of the entire product line.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:319480 |
| Date | January 2017 |
| Creators | Švajdová, Anna |
| Contributors | Surman, Martin, Škaroupka, David |
| Publisher | Vysoké učení technické v Brně. Fakulta strojního inženýrství |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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