A device that is accompanied by an irreversible chemical reaction or physical destruction and could no longer function properly after performing its intended function is referred to as a one-shot device. One-shot device test data differ from typical data obtained by measuring lifetimes in standard life-tests. Due to the very nature of one-shot devices, actual lifetimes of one-shot devices under test cannot be observed, and they are either left- or right-censored. In addition, a one-shot device often has multiple components that could cause the failure of the device. The components are coupled together in the manufacturing process or assembly, resulting in the failure modes possessing latent heterogeneity and dependence. Frailty models enable us to describe the influence of common, but unobservable covariates, on the hazard function as a random effect in a model and also provide an easily understandable interpretation.
In this thesis, we develop some inferential results for one-shot device testing data with gamma frailty model. We first develop an efficient expectation-maximization (EM) algorithm for determining the maximum likelihood estimates of model parameters of a gamma frailty model with exponential lifetime distributions for components based on one-shot device test data with multiple failure modes, wherein the data are obtained from a constant-stress accelerated life-test. The maximum likelihood estimate of the mean lifetime of $k$-out-of-$M$ structured one-shot devices under normal operating conditions is also presented. In addition, the asymptotic variance–covariance matrix of the maximum likelihood estimates is derived, which is then used to construct asymptotic confidence intervals for the model parameters. The performance of the proposed inferential methods is finally evaluated through Monte Carlo simulations and then illustrated with a numerical example. A gamma frailty model with Weibull baseline hazards is considered next for fitting one-shot device testing data. The Weibull baseline hazards enable us to analyze time-varying failure rates more accurately, allowing for a deeper understanding of the dynamic nature of system's reliability. We develop an EM algorithm for estimating the model parameters utilizing the complete likelihood function. A detailed simulation study evaluates the performance of the Weibull baseline hazard model with that of the exponential baseline hazard model. The introduction of shape parameters in the component's lifetime distribution within the Weibull baseline hazard model offers enhanced flexibility in model fitting. Finally, Bayesian inference is then developed for the gamma frailty model with exponential baseline hazard for one-shot device testing data. We introduce the Bayesian estimation procedure using Markov chain Monte Carlo (MCMC) technique for estimating the model parameters as well as for developing credible intervals for those parameters. The performance of the proposed method is evaluated in a simulation study. Model comparison between independence model and the frailty model is made using Bayesian model selection criterion. / Thesis / Candidate in Philosophy
| Identifer | oai:union.ndltd.org:mcmaster.ca/oai:macsphere.mcmaster.ca:11375/29793 |
| Date | January 2024 |
| Creators | Yu, Chenxi |
| Contributors | Balakrishnan, Narayanaswamy, Mathematics and Statistics |
| Source Sets | McMaster University |
| Language | English |
| Detected Language | English |
| Type | Article |
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