Return to search

Transmission Electron Microscopy Analysis of Silicon-Doped Beta-Gallium Oxide Films Grown by Pulsed Laser Deposition

No description available.
Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:wright1580120635333744
Date January 2019
CreatorsBowers, Cynthia Thomason
PublisherWright State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=wright1580120635333744
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

Page generated in 0.0019 seconds