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Optical characterization of defects in GaN /

Thesis (M. Phil.)--University of Hong Kong, 2002. / Includes bibliographical references (leaves 58-61).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/52179955
Date January 2001
CreatorsOr, Chun-tat.
PublisherHong Kong : University of Hong Kong,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView the Table of Contents & Abstract

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