Return to search

High resolution measurements with silicon drift detectors for Compton camera applications

Siegen, University, Diss., 2004.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/76679826
Date January 2005
CreatorsÇonka Nurdan, Tuba.
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceLF

Page generated in 0.0019 seconds