Simulated temperature dependency of SEU sensitivity in A 0.5 [mu]m CMOS SRAM

Description

Thesis (M. S. in Electrical Engineering)--Vanderbilt University, Aug. 2008. / Title from title screen. Includes bibliographical references.

Links & Downloads

1. http://etd.library.vanderbilt.edu/ETD-db/available/etd-08012008-082330/

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/245051825
Date	January 2008
Creators	Sanathanamurthy, Siddartha.
Source Sets	OCLC
Language	English
Detected Language	English
Type	Electronic dissertations.