Return to search

Grain boundary diffusion in thin films : a finite element analysis /

Thesis (Ph. D.)--Lehigh University, 2000. / Includes bibliographical references and vita.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/46955597
Date January 2000
CreatorsHo, Ji-Wei,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeAcademic dissertations

Page generated in 0.0017 seconds