Estudo de orientacoes cristalograficas de acos ao silicio utilizando tecnicas de difracao de raios X, difracao de eletrons e metodo ETCH PIT

Description

Made available in DSpace on 2014-10-09T12:43:57Z (GMT). No. of bitstreams: 0 / Made available in DSpace on 2014-10-09T14:08:19Z (GMT). No. of bitstreams: 1
06781.pdf: 5180316 bytes, checksum: 400f92bad2534a326e86a6f14c3ba5cb (MD5) / Dissertacao (Mestrado) / IPEN/D / Instituto de Pesquisas Energeticas e Nucleares - IPEN/CNEN-SP

Links & Downloads

1. http://repositorio.ipen.br:8080/xmlui/handle/123456789/10783

Tags

iron

silicon

steels

electrical properties

grain size

grain orientation

microstructure

crystallography

scanning electron microscopy

x-ray diffraction

electron diffraction

Additional Fields

Identifer	oai:union.ndltd.org:IBICT/oai:repositorio.ipen.br:123456789/10783
Date	09 October 2014
Creators	SANTOS, HAMILTA de O.
Contributors	Waldemar Alfredo Monteiro
Source Sets	IBICT Brazilian ETDs
Detected Language	Portuguese
Type	info:eu-repo/semantics/publishedVersion, info:eu-repo/semantics/masterThesis
Format	82
Source	reponame:Repositório Institucional do IPEN, instname:Instituto de Pesquisas Energéticas e Nucleares, instacron:IPEN
Coverage	N
Rights	info:eu-repo/semantics/openAccess