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Scanning tunneling microscopy and spectroscopy investigation of the interfacial electronic properties of the N-type LaAlO3/TiO2-SrTiO3 hetero-structure

In this work, the interfacial electronic property between N-type LaAlO3/TiO2-SrTiO3 has been investigated by using scanning tunneling microscopy and spectroscopy (STM/S). With the consideration of the tip-induced band bending effect during STM measurements and in conjunction with the three-dimensional theoretically analysis, the schematic band structure of the hetero-structured SrTiO3/LaAlO3 is also revealed.
Results indicate that the magnitude of the built-in field on the LaAlO3 is (30¡Ó5) mV/Å. The band bending on SrTiO3 side at the heterointerface is also observed. The band downshift of SrTiO3 side at the interface is 0.31 eV with about 0.8 nm decay length.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0905112-165617
Date05 September 2012
CreatorsHuang, Po-Cheng
ContributorsMitch. M.C. Chou, Ya-Ping Chiu, Yung-Sung Chen
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0905112-165617
Rightsuser_define, Copyright information available at source archive

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