High-resolution analytical electron microscopy and creep deformation of silicon nitride ceramics /

Description

Thesis (Ph.D.) -- McMaster University, 1998. / Includes bibliographical references (leaves 186-196). Also available via World Wide Web.

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1. http://libaccess.mcmaster.ca/login?url= http://wwwlib.umi.com/dissertations/fullcit/NQ42855

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/181806265
Date	January 1998
Creators	Jin, Qiang.
Source Sets	OCLC
Language	English
Detected Language	English
Source	*McMaster only