The principal aim of this thesis is to characterise quantitatively the influence of high temperature creep upon the structure of ß-NiAl and ß-NiAl(Fe) single crystals. A non-destructive procedure is established following the classic line of X-ray structure analysis, namely controlling the chemical composition with the electron probe microanalysis, determining the unit cell contents from the combined lattice parameter and mass density measurements, and refining the structure parameters according to the X-ray reflection intensity. Specifically, two special single crystal X-ray diffraction methods, namely the back reflection Kossel technique and the back reflection Laue method, are applied for the determination of lattice parameter and for the collection of intensity data. All experimental measurements can be performed in non-destructive manner, which allows a direct comparison to be made between the crystal structure determined prior to and after a creep test.
| Identifer | oai:union.ndltd.org:DRESDEN/oai:qucosa.de:swb:14-1038216865812-53920 |
| Date | 25 October 2002 |
| Creators | Zhang, Hui |
| Contributors | Technische Universität Dresden, Mathematik und Naturwissenschaften, Physik, Institut für Kristallographie und Festkörperphysik, Prof. Dr. Peter Paufler, Prof. Dr. Peter Paufler, Prof. Dr. Günter Gottstein, Prof. Dr. Hans-Jürgen Ullrich |
| Publisher | Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden |
| Source Sets | Hochschulschriftenserver (HSSS) der SLUB Dresden |
| Language | English |
| Detected Language | English |
| Type | doc-type:doctoralThesis |
| Format | application/pdf |
Page generated in 0.0026 seconds