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A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM

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1. http://dx.doi.org/10.1017/S1431927608080173
2. http://hdl.handle.net/2237/14314
3. 1431-9276
4. Microscopy and Microanalysis. V.14, n.1, 2008, p.27-35

Identifer	oai:union.ndltd.org:NAGOYA/oai:ir.nul.nagoya-u.ac.jp:2237/14314
Date	02 1900
Creators	Tanaka, Nobuo, Kondo, Yushi, Kawai, Tomoyuki, Yamasaki, Jun
Publisher	Cambridge University Press
Source Sets	Nagoya University
Language	English
Detected Language	English
Type	Article(publisher)
Rights	Cambridge University Press