Return to search

Motif-based method for patterned texture defect detection

Thesis (Ph. D.)--University of Hong Kong, 2008. / Includes bibliographical references (leaf 268-284) Also available in print.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/244970462
Date January 2008
CreatorsNgan, Yuk-tung, Henry.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick to view the E-thesis via HKUTO

Page generated in 0.0015 seconds