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Modifikace tenkých vrstev fokusovaným iontovým svazkem. / Thin films modification by focussed ion beam.

The purpouse of the master's thesis is study problematic of focused ion beams and their material influence. In this thesis are described interactions in the sample after impact of ion beam, use and applications of FIB systems. Second part of thesis are simulations of ion influence on different kinds of materials by the help of SRIM program.

Identiferoai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:228536
CreatorsFaltýnek, Petr
ContributorsČechal, Jan
PublisherVysoké učení technické v Brně. Fakulta strojního inženýrství
Source SetsCzech ETDs
LanguageCzech
Detected LanguageEnglish
Typeinfo:eu-repo/semantics/masterThesis
Rightsinfo:eu-repo/semantics/restrictedAccess

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