The dimensions of nanoobjects are important because the properties of nanoobjects are related to dimension and automatic manufacturing inspection of nanoobject requires dimensional information. The current approaches to estimate the projection lengths (one of the important dimensions of nanorods) are manual, error leading and time consuming. So, an automated approach is essential to determine the projection lengths . We propose an innovative approach to estimate projection lengths of nanorods from scanning electron micrographs. Extracting projection length is very crucial to dimensional quality engineering because once we have projection length, we can determine actual length of each nanorod and establish a proper measurement system. The large volume of production of nanorods depends on proper manufacturing process of nanorod which is challenging until there is any proper measurement process exists to understand the manufacturing process of nanorod. Our proposed automated algorithm can extract nanorods by following steps: consider an image of nanorod, determine top edges and side edges of each nanorod separately, associate edges to corresponding nanorods, extract correct nanorods. Then we estimate the projection lengths. Low signal to noise ratio and high degree of overlaps of nanorods in scanning electron micrographs are the major challenges in this research task. Currently there is no image processing algorithm that can measure the dimensions of nanorods from scanning electron micrograph. Hence our research work will contribute to this area. We calculate the total number of true and false detection of nanorods obtained by our automated algorithm. We compare the algorithm with other relevant algorithms (e.g. Normalized cut, Snake and simagis). This research work is promising to dimensional quality control as it can contribute to establish a proper measurement system of nanomanufacturing. / A Thesis submitted to the Department of Industrial and Manufacturing Engineering in partial fulfillment of the requirements for the degree of Master of Science. / Summer Semester 2015. / July 09, 2015. / Nanoinformatics, Nanorods, Particle detection algorithm, Projection Length, Quality / Includes bibliographical references. / Abhishek K. Shrivastava, Professor Directing Thesis; Chiwoo Park, Committee Member; Arda Vanli, Committee Member.
| Identifer | oai:union.ndltd.org:fsu.edu/oai:fsu.digital.flvc.org:fsu_253230 |
| Contributors | Das, Tanmoy (authoraut), Shrivastava, Abhishek Kumar (professor directing thesis), Park, Chiwoo (committee member), Vanli, Omer Arda (committee member), Florida State University (degree granting institution), College of Engineering (degree granting college), Department of Industrial and Manufacturing Engineering Department of Industrial and Manufacturing Engineering (degree granting department) |
| Publisher | Florida State University, Florida State University |
| Source Sets | Florida State University |
| Language | English, English |
| Detected Language | English |
| Type | Text, text |
| Format | 1 online resource (98 pages), computer, application/pdf |
| Rights | This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s). The copyright in theses and dissertations completed at Florida State University is held by the students who author them. |
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