Return to search

An analysis of the relationship between analyst-user cognitive style differences and user resistance to information systems

Bibliography: pages 102-109. / This study investigated the relationships between user resistance to new information systems and other factors, the chief of which was the differences in cognitive problem-solving styles between systems developers (analysts) and users. In addition, associations were tested between user resistance and the following: system accuracy, system reliability, the analyst's attitude, the analyst-user relationship, analyst-user dissonance, the user's age and the user's length of service with his current employer. All data was collected at confidential interviews with the key users and key analysts of 34 post-implementation systems service were recorded at these interviews. Ages and lengths of User resistance was determined from the number of complaints made by users regarding the systems and their manner of implementation. Cognitive style was measured using the Kirton Adaption-innovation Inventory (KAI). All other parameters were measured as responses to suitably phrased questions, quantified using seven-point scales. A significant positive association between user resistance and analyst-user cognitive style difference was found. A model was then developed which enables the estimation of user resistance prior to system development with the aid of the KAI. Significant negative associations were found to exist between user resistance and system accuracy, and user resistance and system reliability. No relationships between user resistance and either user age or user length of service were found.

Identiferoai:union.ndltd.org:netd.ac.za/oai:union.ndltd.org:uct/oai:localhost:11427/15855
Date January 1989
CreatorsMullany, Michael John
ContributorsLay, Peter M Q
PublisherUniversity of Cape Town, Faculty of Commerce, Department of Information Systems
Source SetsSouth African National ETD Portal
LanguageEnglish
Detected LanguageEnglish
TypeMaster Thesis, Masters, MCom
Formatapplication/pdf

Page generated in 0.0068 seconds