Diagnostic tests are designed to detect and isolate faults in sequential systems. The problem is to evaluate the effectiveness of the design. For stuck faults a diagnostic model can be used. A fault simulation strategy is presented for generating this model. First, definitions, for identifying critical inputs are derived. A definition is a statement of the conditions to sensitize an input. Then a fault free simulation is used to generate a critical value array. A critical path is traced through the sensitized inputs marked in the array using a critical value array tracing algorithm that is developed. This algorithm traces a path back in time, as required for a sequential system, to identify detectable faults for the model.
| Identifer | oai:union.ndltd.org:arizona.edu/oai:arizona.openrepository.com:10150/276675 |
| Date | January 1988 |
| Creators | Mann, Timothy Lee, 1950- |
| Contributors | Hill, F. J. |
| Publisher | The University of Arizona. |
| Source Sets | University of Arizona |
| Language | en_US |
| Detected Language | English |
| Type | text, Thesis-Reproduction (electronic) |
| Rights | Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author. |
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