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Process variation-resistant dynamic power optimization of VLSI circuits

Thesis (Ph.D.)--Auburn University, 2005. / Abstract. Vita. Includes bibliographic references (ℓ. 165-179)

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/213466127
Date January 2005
CreatorsHu, Fei,
PublisherAuburn, Ala. ,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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