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VLSI circuit defect diagnosis : open defects and run-time speed

Thesis (Ph. D.)--University of Iowa, 2008. / Thesis supervisor: Sudhakar M. Reddy. Includes bibliographical references (leaves 118-122).

  1. http://ir.uiowa.edu/etd/8
Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/262758620
Date January 2008
CreatorsLiu, Chen.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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