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New tests and test methodologies for scan cell internal faults

Thesis supervisors: Sudhakar M. Reddy, Sreejit Chakravarty. Includes bibliographic references (p. 129-139).

  1. http://ir.uiowa.edu/etd/452
Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/613707569
Date January 2009
CreatorsYang, Fan. Reddy, Sudhakar M. Chakravarty, Sreejit.
Publisher[Iowa City, Iowa] : University of Iowa,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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