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Minimizing N-detect tests for combinational circuits

Thesis (M.S.)--Auburn University, 2007. / Abstract. Vita. Includes bibliographic references (ℓ. 69-74)

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/191865660
Date January 2007
CreatorsKantipudi, Kalyana R.
PublisherAuburn, Ala. ,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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