Information theoretic and spectral methods of test point, partial-scan and full-scan flip-flop insertion to improve integrated circuit testability

Description

Thesis (M.S.)--Rutgers University, 2009. / "Graduate Program in Electrical and Computer Engineering." Includes bibliographical references (p. 125-130).

Links & Downloads

1. http://hdl.rutgers.edu/1782.2/rucore10001600001.ETD.000052257

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/607522534
Date	January 2009
Creators	Ausoori, Raghuveer,
Source Sets	OCLC
Language	English
Detected Language	English