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Built-in self-test of the programmable interconnect in field programmable gate arrays

Thesis (M.S.)--Auburn University, 2008. / Abstract. Vita. Includes bibliographical references (p. 76-77).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/252931286
Date January 2008
CreatorsDixon, Bobby Earl, Stroud, Charles E.,
PublisherAuburn, Ala.,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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