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Atomic-scale calculations of interfacial structures and their properties in electronic materials

Thesis (Ph. D.)--Ohio State University, 2005. / Title from first page of PDF file. Document formatted into pages; contains xvi, 136 p.; also includes graphics (some col.). Includes bibliographical references (p. 125-136). Available online via OhioLINK's ETD Center

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/65429296
Date January 2005
CreatorsLiang, Tao,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to resource

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