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Drift in silicon integrated sensors and circuits due to thermo-mechanical stresses /

Ecole Polytechnique Fédérale, Diss.--Lausanne, 2000.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/247342262
Date January 2000
CreatorsManic, Dragan.
PublisherKonstanz : Hartung-Gorre,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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