This work is aimed to understand the mechanisms for evolution and reversed evolution of dislocation structure under variable strain amplitudes, using automotive-grade interstitial-free steels (IF steel) under strain ratio (R) = 0 condition. The microstructures were mainly examined by the SEM under BEI/ECCI mode and TEM were used for this study.
Near the endurance limit, the dislocation cells smaller than 2£gm develop preferably along grain boundaries and triple junctions among the grains. Within grain interiors, it is hardly observed these small dislocation cells and cyclic hardening even at £`max =0.2%. When strain amplitudes were controlled at a range from £`max = 0.25% to 0.6%, a secondary cyclic hardening occurs prior to fatigue failure and less than 2um dislocation cells rapidly developed thoroughly. The secondary hardening rates were found to be directly proportional to the strain amplitudes.
For high-low strain fatigue tests, while the maximum strain was decreased from 1.2% to 0.2% or 0.15%, dislocation cells were collapsed first and re-grouped into loop-patch structures due to the gliding behavior of dislocations changing from multiple-slips to single-slip. However, once the strain range is further reduced to 0.1%, dislocation cells would persist, showing no signs of collapse. Moreover, the reversal development of dislocation structures is independent of strain ratio. Furthermore newly developed loop patches are usually confined within dislocation domains with very condensed dislocation cell walls with high boundary misorientation.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0702109-122237 |
| Date | 02 July 2009 |
| Creators | Shih, Chia-chang |
| Contributors | Der-Shin Gan, Po-We Kao, Chih-Pu Chang, Li-Hui Chen, New-Jin Ho, Hsing-Lu Huang |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0702109-122237 |
| Rights | not_available, Copyright information available at source archive |
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