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Characterisation of ionisation induced surface effects for the optimisation of silicon detectors for particle physics applications

University, Diss., 2001--Dortmund.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/174882802
CreatorsWüstenfeld, Jens.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeOnline-Publikation.

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