Return to search

Microstructure characterization of high Tc superconducting thin films and multilayer Josephson junctions

published_or_final_version / Physics / Master / Master of Philosophy

  1. 10.5353/th_b3122018
  2. b3122018
Identiferoai:union.ndltd.org:HKU/oai:hub.hku.hk:10722/34171
Date January 1998
Creators楊曄, Yang, Ye.
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Source SetsHong Kong University Theses
LanguageEnglish
Detected LanguageEnglish
TypePG_Thesis
Sourcehttp://hub.hku.hk/bib/B31220186
RightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works., Creative Commons: Attribution 3.0 Hong Kong License
RelationHKU Theses Online (HKUTO)

Page generated in 0.0017 seconds