Return to search

Optimization of STM-tip preparation methods

The Scanning Tunneling Microscope (STM) was invented by Gerd Binnig and Heinrich Rohrer and gave them the Nobel Prize in Physics 1986. STM can give us atomic resolution of a surface by applying a voltage between a very sharp tip (STM-tip) and the surface of a material that we want to examine. The STM-tip is moving over the surface and a computer is collecting the tunnel current in every single point to create a digital image. This diploma work is focused on the preparation of the STM-tip. The preparation method that is used is electrochemical etching of a tungsten wire. The sharper the STM-tip is the better resolution in the STM images we can get. With the purpose to get as sharp tip as possible and with a well-defined geometry, we prepared several tips by systematically varying the etching parameters such as voltage, current, concentration and wire length. A new method has been tested to minimize the oxidation on the surface and finally the tips were characterized with scanning electron microscope (SEM).

Identiferoai:union.ndltd.org:UPSALLA1/oai:DiVA.org:kth-30873
Date January 2011
CreatorsRevenikiotis, Sackis (Athanasios)
PublisherKTH, Materialfysik, MF
Source SetsDiVA Archive at Upsalla University
LanguageEnglish
Detected LanguageEnglish
TypeStudent thesis, info:eu-repo/semantics/bachelorThesis, text
Formatapplication/pdf
Rightsinfo:eu-repo/semantics/openAccess
RelationTRITA-ICT-EX ; 15

Page generated in 0.0023 seconds