Elektronenmikroskopische Untersuchungen zur Segregation von Ga an Al-Korngrenzen

Description

Zugl.: Stuttgart, Univ., Diss., 2003.

Links & Downloads

1. urn:nbn:de:bsz:93-opus-16118
2. http://www.bsz-bw.de/cgi-bin/xvms.cgi?SWB10976177

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/314277443
Date	January 2003
Creators	Schmidt, Steffen,
Publisher	[S.l. : s.n.],
Source Sets	OCLC
Language	German
Detected Language	German
Type	Online-Publikation.