Quantitative in-situ particle characterization using focused beam reflectance measurements

Description

Zugl.: Aachen, Techn. Hochsch., Diss.

Links & Downloads

1. http://d-nb.info/993097561/04

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/423758964
Date	January 2009
Creators	Kail, Norbert
Publisher	Düsseldorf VDI-Verl.
Source Sets	OCLC
Language	English
Detected Language	English