Defects in silicon-germanium strained epitaxial layers.

Description

Thesis (Ph.D.)--McMaster University (Canada), 1993. / Source: Dissertation Abstracts International, Volume: 55-06, Section: B, page: 2345. Adviser: G. C. Weatherly.

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1. http://libaccess.mcmaster.ca/login?url= http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:NN87990

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/181818050
Creators	Dynna, Mark. Weatherly, G.C.
Source Sets	OCLC
Language	English
Detected Language	English
Source	*McMaster only