Conventional level one data caches are widely used in high-performance microprocessors. Shrinking process parameters in chip fabrication technology allow a much larger number of devices on a chip with every new generation. This reduction in device size has led to an increase in the magnitude of a type of energy dissipation hitherto ignored?leakage energy. Transistor level leakage energy research for sub-micron processes has shown that leakage can be as much as or greater than the dynamic energy for advanced circuit designs. Researchers have devised techniques to reduce leakage energy at the fabrication and circuit levels. Transitioning the idle circuits from operating voltage to a reduced voltage is one such circuit-level technique. The ELRU-SEQ replacement policy exploits this technique to control cache bank transitions. This thesis proposes a new cache architecture called 2-way Leakage Reduction Cache (LRC) that uses this replacement policy. The architecture employs xor-mapping function to reduce conflict misses.
| Identifer | oai:union.ndltd.org:MSSTATE/oai:scholarsjunction.msstate.edu:td-1514 |
| Date | 09 December 2006 |
| Creators | Musalappa, Saibhushan |
| Publisher | Scholars Junction |
| Source Sets | Mississippi State University |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Theses and Dissertations |
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