Development of a fast DRAM analyzer and measurement of typical and critical memory access sequences in applications

Description

Zugl.: München, Univ., Diss., 2008

Links & Downloads

1. http://d-nb.info/992163323/04

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/427644336
Date	January 2008
Creators	Albert, Simon
Publisher	München Verl. Dr. Hut
Source Sets	OCLC
Language	English
Detected Language	English