Diffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronics

Description

This thesis explores mechanical behavior of microelectronic devices and lithium-ion batteries. We first examine electromigration-induced void formation in solder bumps by constructing a theory that couples electromigration and creep. The theory can predict the critical current density below which voids do not form. Due to the effects of creep, this quantity is found to be independent of the solder size and decrease exponentially with increasing temperature, different from existing theories. / Engineering and Applied Sciences

Links & Downloads

1. Pharr, Matt Mathews. 2014. Diffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronics. Doctoral dissertation, Harvard University.
2. http://dissertations.umi.com/gsas.harvard:11593
3. http://nrs.harvard.edu/urn-3:HUL.InstRepos:12271804

Tags

Engineering

Mechanics

Materials Science

Fracture

Kinetics

Lithium-ion batteries

Microelectronics

Plasticity

Solders

Additional Fields

Identifer	oai:union.ndltd.org:harvard.edu/oai:dash.harvard.edu:1/12271804
Date	06 June 2014
Creators	Pharr, Matt Mathews
Contributors	Suo, Zhigang, Vlassak, Joost J.
Publisher	Harvard University
Source Sets	Harvard University
Language	en_US
Detected Language	English
Type	Thesis or Dissertation
Rights	open