Diagnostic of photovoltaic cells defects is one of the key step in production. This dissertation thesis deals about diagnosis of photovoltaic cells by radiative recombination of electron - hole pairs. This radiative recombination is known as luminescence. Diagnostic methods using this local light emission in infrared region have innovative potential. The method of electroluminescence is one of the most widely used luminescence methods whose modifications are applied across the industry, especially in semiconductors. The main area of this thesis research is focused on non-destructive analysis of radiated infrared radiation of monocrystalline and polycrystalline solar cells in various modifications of standard electroluminescence method. In this research there are used two types of CCD cameras are used as luminescent radiation detectors. Method of photon emission microscopy is used for magnification element. Local light emission inspection by microscopy should have benefit to qualitative evaluation of solar cells defects. Radiation emitted by the solar cell has a wave character. This fact brings the potential of using some of the characteristics of the waves. We are talking about the intensity and mainly about new characterization by polarization during the detection of defects in the solar cell surface. Innovation of the measuring workplace of the standard electroluminescence method to use polarization analysis is one of the goals of this dissertation thesis.
Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:385281 |
Date | January 2018 |
Creators | Stojan, Radek |
Contributors | Frantík, Ondřej, Šály,, Vladimír, Vaněk, Jiří |
Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
Source Sets | Czech ETDs |
Language | Czech |
Detected Language | English |
Type | info:eu-repo/semantics/doctoralThesis |
Rights | info:eu-repo/semantics/restrictedAccess |
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