This master thesis deals with researching the structure of embedding resin in the Low-Voltage Transmission Electron Microscope (LV TEM). Further, it focuses on researching the surface morphology by the Atomic Force Microscope (AFM) and by the Scanning Electron Microscope (SEM). The principle of each of the microscopes is explained ? the contrast formation and construction of the LV TEM in particular. In the conclusion the evaluation of the effect of the surface structure of the embedding resin on the image contrast in the LV TEM and the analysis of the minimalization of its effect on the final image is given.
Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:50216 |
Date | January 2011 |
Creators | BÍLÝ, Tomáš |
Source Sets | Czech ETDs |
Language | Czech |
Detected Language | English |
Type | info:eu-repo/semantics/masterThesis |
Rights | info:eu-repo/semantics/restrictedAccess |
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