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Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan

William F. Finan. / Includes bibliographical references.

Identiferoai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/17109
Date January 1993
ContributorsFinan, William F, MIT Japan Program.
PublisherMIT Japan Program, Massachusetts Institute of Technology
Source SetsM.I.T. Theses and Dissertation
LanguageEnglish
Detected LanguageEnglish
Format31 p., 2480874 bytes, application/pdf
RelationMITJP (Series) ; 93-01.

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