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Growth and XRD Characterization of Quasicrystals in AlCuFe and Nanoflex Thin Films

<p>Quasicrystals is a new kind of material that have several interesting aspects to it. The unusual atomic structure entails many anomalous and unique physical properties, for example, high hardness, and extremely low electrical and thermal conductivity. In thin films quasicrystals would enable new functional materials with a combination of attractive properties.In this work, AlCuFe and Nanoflex steel, materials that are known to form quasicrystals in bulk, have been deposited as thin films on Si and Al2O3 substrates using DC magnetron sputtering. These thin films were heat treated, and the formation and growth of different phases, among other approximant and quasicrystalline phases, were studied using mainly in-situ X-ray diffraction.During the project several problems with the formation of quasicrystals were encountered, and it is proposed how to overcome these problems, or even how to make use of them. Finally, the quasicrystalline phase was realized, although it was not completely pure. In the end some suggestions for future work is presented.</p>

Identiferoai:union.ndltd.org:UPSALLA/oai:DiVA.org:liu-15140
Date January 2008
CreatorsOlsson, Simon
PublisherLinköping University, The Department of Physics, Chemistry and Biology
Source SetsDiVA Archive at Upsalla University
LanguageEnglish
Detected LanguageEnglish
TypeStudent thesis, text

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