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Highly accurate dimensional metrology via microscopy based vision system /

Thesis (Ph.D.)--Tufts University, 1999. / Adviser: Haris Doumanidis. Submitted to the Dept. of Mechanical Engineering. Includes bibliographical references (leaves 201-207). Access restricted to members of the Tufts University community. Also available via the World Wide Web;

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/190833693
Date January 1900
CreatorsDurvasula, Ravi Shankar.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to Dissertations & Theses @ Tufts University.

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