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Warpage characterization and lithographic limitations of FR-4 for SOP global interconnect needs

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Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/14853
Date08 1900
CreatorsBanerji, Sounak
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeThesis
RightsAccess restricted to authorized Georgia Tech users only.

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