Return to search

Warpage characterization and lithographic limitations of FR-4 for SOP global interconnect needs

No description available.
Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/14853
Date08 1900
CreatorsBanerji, Sounak
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeThesis
RightsAccess restricted to authorized Georgia Tech users only.

Page generated in 0.0017 seconds