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Determining spectral sensitivity of Kodak micro positive resist 820 /

Thesis (B.S.)--Rochester Institute of Technology, 1983. / Typescript. Includes bibliographical references (leaves 40-42).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/25808781
Date January 1983
CreatorsHuck, Matthew L.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceOnline version of thesis

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