This work deal with problems of investigation materials electron beam. This project is focuses on investigation materials by the help of method environmental scan electron microscopy (ESEM) and describes her patterns. The perfection of ESEM excel above all at studies non - conducting or water containing, often biological samples. These samples not to be in no way prepared or cut – and – dries, in contradistinction to classical scanning electron microscope and thanks is under investigation their native surface structure without desiccation breaking. The general aim is determination of contrast in image acquired by ionization detector.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:219043 |
| Date | January 2011 |
| Creators | Goroš, Pavel |
| Contributors | Čudek, Pavel, Jirák, Josef |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
Page generated in 0.0017 seconds