by Kwan Wai Wing Eric. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1996. / Includes bibliographical references. / ABSTRACT / ACKNOWLEDGMENT / LIST OF FIGURES / LIST OF TABLES / Chapter Chapter 1 --- Introduction / Chapter 1.1 --- Background --- p.1-1 / Chapter 1.2 --- E-Beam testing and test generation algorithm --- p.1-2 / Chapter 1.3 --- Motivation of this research --- p.1-4 / Chapter 1.4 --- Out-of-kilter Algorithm --- p.1-6 / Chapter 1.5 --- Outline of the remaining chapter --- p.1-7 / Chapter Chapter 2 --- Electron Beam Testing / Chapter 2.1 --- Background and Theory --- p.2-1 / Chapter 2.2 --- Principles and Instrumentation --- p.2-4 / Chapter 2.3 --- Implication of internal IC testing --- p.2-6 / Chapter 2.4 --- Advantage of Electron Beam Testing --- p.2-7 / Chapter Chapter 3 --- An exhaustive method to minimize test sets / Chapter 3.1 --- Basic Principles --- p.3-1 / Chapter 3.1.1 --- Controllability and Observability --- p.3-1 / Chapter 3.1.2 --- Single Stuck at Fault Model --- p.3-2 / Chapter 3.2 --- Fault Dictionary --- p.3-4 / Chapter 3.2.1 --- Input Format --- p.3-4 / Chapter 3.2.2 --- Critical Path Generation --- p.3-6 / Chapter 3.2.3 --- Probe point insertion --- p.3-8 / Chapter 3.2.4 --- Formation of Fault Dictionary --- p.3-9 / Chapter Chapter 4 --- Mathematical Model - Out-of-kilter algorithm / Chapter 4.1 --- Network Model --- p.4-1 / Chapter 4.2 --- Linear programming model --- p.4-3 / Chapter 4.3 --- Kilter states --- p.4-5 / Chapter 4.4 --- Flow change --- p.4-7 / Chapter 4.5 --- Potential change --- p.4-9 / Chapter 4.6 --- Summary and Conclusion --- p.4-10 / Chapter Chapter 5 --- Apply Mathematical Method to minimize test sets / Chapter 5.1 --- Implementation of OKA to the Fault Dictionary --- p.5-1 / Chapter 5.2 --- Minimize test set and optimize internal probings / probe points --- p.5-5 / Chapter 5.2.1 --- Minimize the number of test vectors --- p.5-5 / Chapter 5.2.2 --- Find the optimum number of internal probings --- p.5-8 / Chapter 5.2.3 --- Find the optimum number of internal probe points --- p.5-11 / Chapter 5.3 --- Fixed number of internal probings/probe points --- p.5-12 / Chapter 5.4 --- True minimum test set and optimum probing/ probe point --- p.5-14 / Chapter Chapter 6 --- Implementation and work examples / Chapter 6.1 --- Generation of Fault Dictionary --- p.6-1 / Chapter 6.2 --- Finding the minimum test set without internal probe point --- p.6-5 / Chapter 6.3.1 --- Finding the minimum test set with optimum internal probing --- p.6-10 / Chapter 6.3.2 --- Finding the minimum test set with optimum internal probe point --- p.6-24 / Chapter 6.4 --- Finding the minimum test set by fixing the number of internal probings at 2 --- p.6-26 / Chapter 6.5 --- Program Description --- p.6-35 / Chapter Chapter 7 --- Realistic approach to find the minimum solution / Chapter 7.1 --- Problem arising in exhaustive method --- p.7-1 / Chapter 7.2 --- Improvement work on existing test generation algorithm --- p.7-2 / Chapter 7.3 --- Reduce the search set --- p.7-5 / Chapter 7.3.1 --- Making the Fault Dictionary from existing test generation algorithm --- p.7-5 / Chapter 7.3.2 --- Making the Fault Dictionary by random generation --- p.7-9 / Chapter Chapter 8 --- Conclusions / Chapter 8.1 --- Summary of Results --- p.8-1 / Chapter 8.2 --- Further Research --- p.8-5 / REFERENCES --- p.R-1 / Chapter Appendix A --- Fault Dictionary of circuit SC1 --- p.A-1 / Chapter Appendix B --- Fault Dictionary of circuit SC7 --- p.B-1 / Chapter Appendix C --- Simple Circuits Layout --- p.C-1
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_321567 |
| Date | January 1996 |
| Contributors | Kwan, Wai Wing Eric., Chinese University of Hong Kong Graduate School. Division of Electronic Engineering. |
| Publisher | Chinese University of Hong Kong |
| Source Sets | The Chinese University of Hong Kong |
| Language | English |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, 1 v. (various pagings) : ill. ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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