Micro-Raman investigation of mechanical stress in Si device structures and phonons in SiGe

Description

Brandenburgische Techn. Univ, Diss., 2000--Cottbus.

Links & Downloads

1. http://deposit.d-nb.de/cgi-bin/dokserv?idn=961806672
2. http://se6.kobv.de:8000/btu/volltexte/2007/117/pdf/diss_dombrowski.pdf
3. http://se6.kobv.de:8000/btu/volltexte/2007/117/

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/614473859
Creators	Dombrowski, Kai F.
Source Sets	OCLC
Language	English
Detected Language	English
Type	Online-Publikation.