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Built-in-self-test of RF front-end circuitry /

Thesis (Ph.D.)--Rochester Institute of Technology, 2005. / Typescript. Includes bibliographical references (leaves 136-139).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/61850239
Date January 2005
CreatorsGopalan, Anand.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceLink to online version

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